Automated and scalable T-wise test case generation strategies for Software Product Lines

ICST 2010 - 3rd International Conference on Software Testing, Verification and Validation

Volumn , Issue , 2010, Pages 459-468

  Perrouin, Gilles ^a   Sen, Sagar ^b   Klein, Jacques ^c   Baudry, Benoit ^b   Le Traon, Yves ^a  

^a UNIVERSITY OF LUXEMBOURG   (Luxembourg)

^b CAMPUS DE BEAULIEU   (France)

^c LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY   (Luxembourg)

Author keywords

Alloy; Model based engineering and testing; Software Product Lines; T wise and pairwise; Test generation

Indexed keywords

ALL-AT-ONCE; AUTOMATIC GENERATION; COMBINATORIAL EXPLOSION; COMBINATORICS; EXHAUSTIVE TESTING; FEATURE INTERACTIONS; LARGE SPACES; MODEL-BASED ENGINEERING; SAT SOLVERS; SOFTWARE PRODUCT LINE; SOFTWARE PRODUCT LINES; T-WISE AND PAIRWISE; TEST CASE; TEST CASE GENERATION; TEST GENERATIONS; TEST PRODUCTS; TESTING SOFTWARE; TOOLSETS;

ALLOYS; SOFTWARE TESTING; TESTING; VERIFICATION;

COMPUTER SOFTWARE SELECTION AND EVALUATION;

EID: 77954510052     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICST.2010.43     Document Type: Conference Paper

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