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Volumn , Issue , 2010, Pages 45-54

(Un-)covering equivalent mutants

Author keywords

Code coverage; Dynamic analysis; Mutation testing

Indexed keywords

ARTIFICIAL DEFECTS; CLASSIFICATION PRECISION; CODE COVERAGE; DATA SETS; DYNAMIC INVARIANTS; JAVA PROGRAM; LINES OF CODE; MANUAL CLASSIFICATION; MUTATION TESTING; OPEN SOURCES; PROGRAM SEMANTICS; REAL DEFECTS; STATE OF THE ART;

EID: 77954479049     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICST.2010.30     Document Type: Conference Paper
Times cited : (106)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.