Nanoscale patterning of microtextured surfaces to control superhydrophobic robustness

Langmuir

Volumn 26, Issue 11, 2010, Pages 8319-8326

  Cha, Tae Gon ^a,b   Yi, Jin Woo ^c   Moon, Myoung Woon ^c   Lee, Kwang Ryeol ^c   Kim, Ho Young ^a  

^a Seoul National University   (South Korea)

^b PURDUE UNIVERSITY   (United States)

^c Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL SURFACES; BOTTOM SURFACES; DROP EVAPORATION; LIQUID PRESSURE; LOTUS LEAF; MICRO PILLARS; MICRO-TEXTURED SURFACES; NANO-SCALE ROUGHNESS; NANOPILLARS; NANOROUGHNESS; NANOSCALE PATTERNING; NONWETTING BEHAVIOR; ROUGH SURFACES; ROUGHNESS STRUCTURES; SUPER-HYDROPHOBIC SURFACES; SUPERHYDROPHOBIC;

LIQUIDS; LITHOGRAPHY; NANOSTRUCTURED MATERIALS;

HYDROPHOBICITY;

EID: 77954403079     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la9047402     Document Type: Article

References (25)

1. Norton, F. J. U.S. Patent 2, 386, 259, Oct 9, 1945.
2. Gao, L.; McCarthy, T. J. Langmuir 2006, 22, 5998-6000.
3. Cassie. A. B. D.; Baxter, S. Tram. Faraday Soc. 1944, 40, 546-550.
4. Lafuma, A.; Quéré, D. Nat. Mater. 2003, 2, 457-460.
5. Reyssat, M.; Yeomans, J. M.; Quéré, D. Europhys. Lett. 2008, 81, 26006.
6. Kwon, Y.; Patankar, N.; Choi, J.; Lee, J. Langmuir 2009, 25, 6129-6136.
7. Neinhuis, C.; Barthlott, W. Ann. Bot. 1997, 79, 667-677.
8. Gao, X.; Jiang, L. Nature 2004, 432, 36.
9. Hansen, W. R.; Autumn, K. Proc. Natl. Acad. Sci. U.S.A. 2005, 102, 385-389.
10. Cho, W. K.; Choi, I. S. Adv. Funct. Mater. 2008, 18, 1089-1096.
11. Byun, D.; Hong, J.; Saputra; Ko, J. H.; Lee. Y. J.; Park, H. C.; Byun, B.-K.; Lukes, J. R. J. Bionic Eng. 2009, 6, 63-70.
12. Jeong, H. E.; Lee, S. H.; Kim, J. K.; Suh, K. Y. Langmuir 2006, 22, 1640-1645.
13. Gao, X.; Yao, X.; Jiang, L. Langmuir 2007, 23, 48864891.
14. Cortese, B.; D'Amone, S.; Manca. M.; Viola, I.; Cingolani, R.; Gigli, G. Langmuir 2008, 24, 2712-2718.
15. Bhushan, B.; Koch, K.; Jung, Y. C. Soft Matter 2008, 4, 1799-1804.
16. Lee, Y.; Park, S.-H.; Kim, K.-B.; Lee, J.-K. Adv. Mater. 2007, 19, 2330-2335.
17. Barthlott, W.; Neinhuis. C. Planta 1997, 202, 1-8.
18. Wenzel, R. N. Ind. Eng. Chem. 1936, 28, 988-994.
19. Kim, T.-Y.; Ingmar, B.; Bewilogua, K.; Oh, K. H.; Lee, K.-R. Chem. Phys. Lett. 2007, 436, 199-203.
20. Zhao, Y.-.P.; Dortar, J. T.; Wang, G.-C.; Lu, T.-M. Phys. Rev. Lett. 1999, 82, 4882-4885.
21. Detter, X.; Palla, R.; Thomas-Boutherin, I.; Pargon, E.; Cunge, G.; Joubert, O.; Valuer, L. J. Vac. Sci. Technol., B 2003, 21, 2174-2183.
22. Grischke, M.; Hieke, A.; Morgenweck, F.; Dimigen, H. Diamond Relat. Mater. 1998, 7, 454-158.
23. Callies, M.; Chen, Y.; Marty, F.; Pépin, A.; Quéré, D. Microelectron. Eng. 2005, 78- 79, 100-105.
24. Choi, C.-H.; Kim, C.-J. Phys. Rev. Lett. 2006, 96, 066001.
25. Kusumaatmaja, H.; Blow, M. L.; Dupuis, A.; Yeomans, J. M. Europhys. Lett. 2008, 81, 36003.