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Volumn 96, Issue 26, 2010, Pages

Comparison on the electroluminescence of Si-rich SiNx and SiOx based light-emitting diodes

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER HEIGHTS; CARRIER CONFINEMENTS; CHARGE LOSS; INDIUM TIN OXIDE; INTERFACIAL BARRIERS; METAL-INSULATOR-SEMICONDUCTORS; NC INTERFACE; ON CURRENTS; SHORTER DELAYS; SI NANOCRYSTAL;

EID: 77954318019     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3459144     Document Type: Article
Times cited : (100)

References (12)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.