Nanoscale precipitates in magnetostrictive Fe1-xGax alloys for 0.1 < x < 0.23

Journal of Alloys and Compounds

Volumn 501, Issue 1, 2010, Pages 148-153

  Bhattacharyya, Somnath ^a   Jinschek, J R ^b   Li, J F ^c   Viehland, D ^c  

^a TATA INSTITUTE OF FUNDAMENTAL RESEARCH   (India)

^b Thermo Fisher Scientific   (United States)

^c Virginia Polytechnic Institute and State University   (United States)

Author keywords

Galfenol alloys; High resolution transmission microscopy; Line defects; Magnetostrictive alloys

Indexed keywords

GALFENOL; GALFENOL ALLOYS; HIGH-RESOLUTION TRANSMISSION MICROSCOPIES; LINE DEFECTS; MAGNETOSTRICTIVE ALLOYS;

ALLOYS; DEFECTS; GALLIUM; MAGNETOSTRICTIVE DEVICES; PHASE INTERFACES; SCANNING ELECTRON MICROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 77954218959     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.04.063     Document Type: Article

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