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Volumn 82, Issue 13, 2010, Pages 5777-5782

Open probe: A device for ultra fast electron ionization mass spectrometry analysis

Author keywords

[No Author keywords available]

Indexed keywords

ADDITIONAL SAMPLES; AGILENT; AIR LEAKAGE; CYCLE TIME; ELECTRON IONIZATION; FLOW RESTRICTION; GAS CHROMATOGRAPH MASS SPECTROMETERS; HELIUM PURGE; ION SUPPRESSION; LIBRARY SEARCH; LOW COSTS; ROOM AIR; SAMPLE ANALYSIS; SAMPLE HOLDERS; SUPERSONIC MOLECULAR BEAM; TRANSFER LINES; ULTRA-FAST;

EID: 77954198824     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac100834h     Document Type: Article
Times cited : (10)

References (14)
  • 6
  • 12
    • 77954211642 scopus 로고    scopus 로고
    • Open Probe Method and Device for Sample Introduction for Mass Spectrometry Analysis. Israel Patent Application, 2008, U.S.A. and Japan Patent Applications, 2009
    • Amirav, A. and Gordin, A. Open Probe Method and Device for Sample Introduction for Mass Spectrometry Analysis. Israel Patent Application, 2008, U.S.A. and Japan Patent Applications, 2009.
    • Amirav, A.1    Gordin, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.