Interaction of short cracks with the local microstructure

Procedia Engineering

Volumn 2, Issue 1, 2010, Pages 163-171

  Marx, M ^a   Schaef, W ^a   Vehoff, H ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

BCS model; Focused ion beam tomography; Grain boundaries; Microstructural crack propagation; Short fatigue crack growth

Indexed keywords

BCS MODEL; MICRO-STRUCTURAL; SHORT FATIGUE CRACK GROWTH; SHORT FATIGUE CRACKS;

BEAM PLASMA INTERACTIONS; FATIGUE CRACK PROPAGATION; FATIGUE OF MATERIALS; FOCUSED ION BEAMS; GRAIN BOUNDARIES; GRAIN GROWTH; GRAIN SIZE AND SHAPE; ION BOMBARDMENT; IONS; MICROSTRUCTURE; TOMOGRAPHY;

CRACKS;

EID: 77954194641     PISSN: None     EISSN: 18777058     Source Type: Conference Proceeding    
DOI: 10.1016/j.proeng.2010.03.018     Document Type: Conference Paper

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5. Holzapfel C., Schäf W., Marx M., Vehoff H., Mücklich F., Scripta Mat., Vol.56, p. 697, 2007
6. Marx M., Schäf W., Vehoff H., Holzapfel C., Mat.. Sci. Eng. A, Vol 435-4436, p. 595, 2006