SCOPUS 정보 검색 플랫폼

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 28, Issue 4, 2010, Pages 643-646

Hot-electron transport studies of the Ag/Si(001) interface using ballistic electron emission microscopy

(4) Garramone, J J a Abel, J R a Sitnitsky, I L a LaBella, V P a

a STATE UNIVERSITY OF NEW YORK (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BALLISTIC ELECTRON EMISSION MICROSCOPY; DEPOSITED METAL; ELECTRON TRANSMISSION; EX SITU; HOT-ELECTRON TRANSPORT; IN-SITU; IN-SITU DEPOSITION; METAL FILM; METAL OVERLAYERS; SCHOTTKY BARRIER HEIGHTS; SCHOTTKY DIODES; SEMICONDUCTING SUBSTRATES; SI(0 0 1);

BALLISTICS; ELECTRON TRANSITIONS; ELECTRON TRANSPORT PROPERTIES; METALLIC FILMS; SCANNING TUNNELING MICROSCOPY; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR GROWTH; TRANSPORT PROPERTIES;

ELECTRON EMISSION;

EID: 77954182738 PISSN: 07342101 EISSN: None Source Type: Journal
DOI: 10.1116/1.3397795 Document Type: Conference Paper

Times cited : (9)

References (15)

1
- 77954181945
- International Technology Roadmafor Semiconductors, 2005 edition.
- International Technology Roadmap for Semiconductors, 2005 edition, www.itrs.net.

2
- 0000179978
- Scaling properties and electromigration resistance of sputtered Ag metallization lines
- DOI 10.1063/1.1345801
- M. Hauder, J. Gstottner, W. Hansch, and D. Schmitt-Landsiedel, Appl. Phys. Lett. APPLAB 0003-6951 78, 838 (2001). 10.1063/1.1345801 (Pubitemid 33630367)
- (2001) Applied Physics Letters , vol.78 , Issue.6 , pp. 838-840
- Hauder, M.¹ Gstottner, J.² Hansch, W.³ Schmitt-Landsiedel, D.⁴

3
- 4544282492
- MIENEF 0167-9317,. 10.1016/j.mee.2004.07.041
- W. Zhang, S. H. Brongersma, O. Richard, B. Brijs, R. Palmans, L. Froyen, and K. Maex, Microelectron. Eng. MIENEF 0167-9317 76, 146 (2004). 10.1016/j.mee.2004.07.041
- (2004) Microelectron. Eng. , vol.76 , pp. 146
- Zhang, W.¹ Brongersma, S.H.² Richard, O.³ Brijs, B.⁴ Palmans, R.⁵ Froyen, L.⁶ Maex, K.⁷

4
- 0000453141
- PRLTAO 0031-9007,. 10.1103/PhysRevLett.82.446
- H. Nienhaus, H. S. Bergh, B. Gergen, A. Majumdar, W. H. Weinberg, and E. W. McFarland, Phys. Rev. Lett. PRLTAO 0031-9007 82, 446 (1999). 10.1103/PhysRevLett.82.446
- (1999) Phys. Rev. Lett. , vol.82 , pp. 446
- Nienhaus, H.¹ Bergh, H.S.² Gergen, B.³ Majumdar, A.⁴ Weinberg, W.H.⁵ McFarland, E.W.⁶

5
- 0032620314
- APPLAB 0003-6951,. 10.1063/1.123256
- H. Nienhaus, H. S. Bergh, B. Gergen, A. Majumdar, W. H. Weinberg, and E. W. McFarland, Appl. Phys. Lett. APPLAB 0003-6951 74, 4046 (1999). 10.1063/1.123256
- (1999) Appl. Phys. Lett. , vol.74 , pp. 4046
- Nienhaus, H.¹ Bergh, H.S.² Gergen, B.³ Majumdar, A.⁴ Weinberg, W.H.⁵ McFarland, E.W.⁶

6
- 0002905471
- JJAPA5 0021-4922,. 10.1143/JJAP.8.749
- T. Arizumi and M. Hirose, Jpn. J. Appl. Phys. JJAPA5 0021-4922 8, 749 (1969). 10.1143/JJAP.8.749
- (1969) Jpn. J. Appl. Phys. , vol.8 , pp. 749
- Arizumi, T.¹ Hirose, M.²

7
- 0029256236
- SUSCAS 0039-6028,. 10.1016/0039-6028(94)00791-8
- R. F. Schmitsdorf, T. U. Kampen, and W. Monch, Surf. Sci. SUSCAS 0039-6028 324, 249 (1995). 10.1016/0039-6028(94)00791-8
- (1995) Surf. Sci. , vol.324 , pp. 249
- Schmitsdorf, R.F.¹ Kampen, T.U.² Monch, W.³

8
- 36149010540
- PRVAAH 0096-8250,. 10.1103/PhysRev.127.2006
- C. R. Crowell, W. G. Spitzer, L. E. Howarth, and E. E. LaBate, Phys. Rev. PRVAAH 0096-8250 127, 2006 (1962). 10.1103/PhysRev.127.2006
- (1962) Phys. Rev. , vol.127 , pp. 2006
- Crowell, C.R.¹ Spitzer, W.G.² Howarth, L.E.³ Labate, E.E.⁴

9
- 51349110053
- NNOTER 0957-4484,. 10.1088/0957-4484/19/37/375706
- A. Bannani, C. A. Bobisch, M. Matena, and R. Moller, Nanotechnology NNOTER 0957-4484 19, 375706 (2008). 10.1088/0957-4484/19/37/375706
- (2008) Nanotechnology , vol.19 , pp. 375706
- Bannani, A.¹ Bobisch, C.A.² Matena, M.³ Moller, R.⁴

10
- 68349127561
- JVTBD9 1071-1023,. 10.1116/1.3136761
- J. J. Garramone, J. R. Abel, I. L. Sitnitsky, R. L. Moore, and V. P. LaBella, J. Vac. Sci. Technol. B JVTBD9 1071-1023 27, 2044 (2009). 10.1116/1.3136761
- (2009) J. Vac. Sci. Technol. B , vol.27 , pp. 2044
- Garramone, J.J.¹ Abel, J.R.² Sitnitsky, I.L.³ Moore, R.L.⁴ Labella, V.P.⁵

11
- 27944437312
- Combined molecular beam epitaxy low temperature scanning tunneling microscopy system: Enabling atomic scale characterization of semiconductor surfaces and interfaces
- DOI 10.1116/1.1941167
- M. Krause, A. Stollenwerk, C. Awo-Affouda, B. Maclean, and V. P. LaBella, J. Vac. Sci. Technol. B JVTBD9 1071-1023 23, 1684 (2005). 10.1116/1.1941167 (Pubitemid 43127267)
- (2005) Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures , vol.23 , Issue.4 , pp. 1684-1689
- Krause, M.¹ Stollenwerk, A.² Awo-Affouda, C.³ MacLean, B.⁴ Labella, V.P.⁵

12
- 17244365811
- PRLTAO 0031-9007,. 10.1103/PhysRevLett.61.2368
- L. D. Bell and W. J. Kaiser, Phys. Rev. Lett. PRLTAO 0031-9007 61, 2368 (1988). 10.1103/PhysRevLett.61.2368
- (1988) Phys. Rev. Lett. , vol.61 , pp. 2368
- Bell, L.D.¹ Kaiser, W.J.²

13
- 4243292542
- PRLTAO 0031-9007,. 10.1103/PhysRevLett.66.2511
- M. Prietsch and R. Ludeke, Phys. Rev. Lett. PRLTAO 0031-9007 66, 2511 (1991). 10.1103/PhysRevLett.66.2511
- (1991) Phys. Rev. Lett. , vol.66 , pp. 2511
- Prietsch, M.¹ Ludeke, R.²

14
- 0003752338
- (Cambridge University Press, Cambridge).
- A. Zangwill, Physics at Surfaces (Cambridge University Press, Cambridge, 1988).
- (1988) Physics at Surfaces
- Zangwill, A.¹

15
- 26444545556
- JVTBD9 1071-1023,. 10.1116/1.1306334
- R. P. Lu, B. A. Morgan, K. L. Kavanagh, C. J. Powell, P. J. Chen, F. G. Serpa, and W. F. Egelhoff, Jr., J. Vac. Sci. Technol. B JVTBD9 1071-1023 18, 2047 (2000). 10.1116/1.1306334
- (2000) J. Vac. Sci. Technol. B , vol.18 , pp. 2047
- Lu, R.P.¹ Morgan, B.A.² Kavanagh, K.L.³ Powell, C.J.⁴ Chen, P.J.⁵ Serpa, F.G.⁶ Egelhoff Jr., W.F.⁷

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.