Amorphous In-Ga-Zn-O TFT-LCDs with high reliability

IDW '09 - Proceedings of the 16th International Display Workshops

Volumn 3, Issue , 2009, Pages 1685-1688

  Ohta, Yoshifumi ^a   Chikama, Yoshimasa ^a   Hara, Takeshi ^a   Mizuno, Yuuji ^a   Aita, Tetsuya ^a   Takei, Michiko ^a   Suzuki, Masahiko ^a   Nakagawa, Okifumi ^a   Harumoto, Yoshiyuki ^a   Nishiki, Hirohiko ^a   Kimura, Naofumi ^a  

^a SHARP CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RELIABILITY; HIGH TEMPERATURE; TFT PROCESS; TFT RELIABILITY; TFT-LCDS;

GALLIUM; LIQUID CRYSTAL DISPLAYS; ZINC;

RELIABILITY;

EID: 77954169321     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)

1. K. Nomura: Nature 432, 488 (2004).