Visualization of a phantom post-yield deformation process in cortical bone

Journal of Biomechanics

Volumn 43, Issue 10, 2010, Pages 1989-1996

  Sun, Xuanhao ^a   Hoon Jeon, Ji ^a   Blendell, John ^b   Akkus, Ozan ^a  

^a PURDUE UNIVERSITY   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

Bone damage; Collagen; Digital image correlation; Fluorescent probing; Mineral crystal

Indexed keywords

BONE MATRIX; CHARGED DYES; CHARGED SPECIES; COLLAGEN MOLECULES; CORE REGION; CORTICAL BONE; DEFORMATION PROCESS; DIGITAL IMAGE CORRELATIONS; FLUORESCENT DYES; FLUORESCENT PROBING; LARGE STRAINS; MICRON SCALE; NANO SCALE; NANO-PLATELETS; POSITIVELY CHARGED; PRINCIPAL STRAIN; PROCESS ZONE; RESIDUAL STRAINS; SIZE SCALE; SUBMICRON; THIN WAFERS; UNLOADED STATE;

ATOMIC FORCE MICROSCOPY; COLLAGEN; DEFORMATION; DIGITAL IMAGE STORAGE; FATIGUE OF MATERIALS; FLUORESCENCE; IMAGE PROCESSING; MINERALS; OPACITY; OPTICAL MICROSCOPY; SILICATE MINERALS; STRAIN; STRAIN MEASUREMENT; UNLOADING; VISUALIZATION;

BONE;

COLLAGEN; FLUORESCENT DYE; MINERAL;

ANIMAL TISSUE; ARTICLE; ATOMIC FORCE MICROSCOPY; BONE DEFORMATION; BONE INJURY; BONE MATRIX; CONTROLLED STUDY; CORTICAL BONE; CRYSTAL; DIGITAL IMAGING; FEMUR; FLUORESCENCE ANALYSIS; MECHANICAL STIMULATION; MOLECULAR WEIGHT; NONHUMAN; PHANTOM; PRIORITY JOURNAL; STRESS STRAIN RELATIONSHIP; SURFACE CHARGE;

BONE AND BONES; COMPUTER SIMULATION; HUMANS; MICROSCOPY, ATOMIC FORCE; PHANTOMS, IMAGING; STRESS, MECHANICAL;

EID: 77954144970     PISSN: 00219290     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jbiomech.2010.03.011     Document Type: Article

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