Surface charge density wave phase transition in NbSe3

Physical Review Letters

Volumn 104, Issue 25, 2010, Pages

  Brun, Christophe ^a,c   Wang, Zhao Zhong ^a   Monceau, Pierre ^a   Brazovskii, Serguei ^b  

^a CNRS   (France)

^b UNIVERSITÉ PARIS SUD   (France)

^c EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

FIRST-ORDER; IN-SITU; KOSTERLITZ-THOULESS; ORDER PARAMETER; PHONON MODE; PLAUSIBLE MECHANISMS; SCANNING TUNNELING MICROSCOPY (STM); STM IMAGES; SURFACE CRITICAL TEMPERATURE; SURFACE ENHANCEMENT; SURFACE TRANSITIONS; TEMPERATURE DEPENDENCE; WAVE NUMBERS;

CHARGE DENSITY; FOURIER TRANSFORMS; IMAGE PROCESSING; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; TEMPERATURE DISTRIBUTION; TWO DIMENSIONAL; WAVELET TRANSFORMS;

CHARGE DENSITY WAVES;

EID: 77954126190     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.104.256403     Document Type: Article

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