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Volumn 12, Issue 6, 2010, Pages 509-516
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Temperature-dependent solid-state reactions with and without Kirkendall effect in Al2O3/ZnO, Fe2O3/ZnO, and CoXOY/ZnO oxide thin film systems
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALYTICAL METHOD;
FINAL STATE;
GRAZING INCIDENCE X-RAY DIFFRACTION;
KIRKENDALL EFFECTS;
KIRKENDALL VOID;
OPTICAL REFLECTION;
SPINEL FORMATION;
SQUID MAGNETOMETRY;
TEMPERATURE DEPENDENT;
THIN FILM OXIDES;
X RAY REFLECTIVITY;
ZNO;
ZNO FILMS;
ZNO OXIDE;
DIFFUSION;
FERROMAGNETISM;
LIGHT TRANSMISSION;
SCANNING ELECTRON MICROSCOPY;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
YTTERBIUM COMPOUNDS;
ZINC OXIDE;
SOLID STATE REACTIONS;
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EID: 77954113778
PISSN: 14381656
EISSN: 15272648
Source Type: Journal
DOI: 10.1002/adem.201000043 Document Type: Article |
Times cited : (12)
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References (16)
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