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Volumn 12, Issue 6, 2010, Pages 509-516

Temperature-dependent solid-state reactions with and without Kirkendall effect in Al2O3/ZnO, Fe2O3/ZnO, and CoXOY/ZnO oxide thin film systems

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL METHOD; FINAL STATE; GRAZING INCIDENCE X-RAY DIFFRACTION; KIRKENDALL EFFECTS; KIRKENDALL VOID; OPTICAL REFLECTION; SPINEL FORMATION; SQUID MAGNETOMETRY; TEMPERATURE DEPENDENT; THIN FILM OXIDES; X RAY REFLECTIVITY; ZNO; ZNO FILMS; ZNO OXIDE;

EID: 77954113778     PISSN: 14381656     EISSN: 15272648     Source Type: Journal    
DOI: 10.1002/adem.201000043     Document Type: Article
Times cited : (12)

References (16)
  • 10
    • 77954102007 scopus 로고    scopus 로고
    • information about program "fewlay" can be obtained from Andreas Stierle stierle@mf.mpg.de
    • The information about program "fewlay" can be obtained from Andreas Stierle (stierle@mf.mpg.de).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.