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Volumn 3, Issue , 2008, Pages 1599-1600

Highly uniform single-grain Si TFTs inside (110) orientated large Si grains

Author keywords

[No Author keywords available]

Indexed keywords

CZOCHRALSKI PROCESS; GLASS SUBSTRATES; STANDARD DEVIATION;

EID: 77954099007     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.