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Volumn 3, Issue , 2008, Pages 1599-1600
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Highly uniform single-grain Si TFTs inside (110) orientated large Si grains
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Author keywords
[No Author keywords available]
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Indexed keywords
CZOCHRALSKI PROCESS;
GLASS SUBSTRATES;
STANDARD DEVIATION;
SECONDARY ION MASS SPECTROMETRY;
SUBSTRATES;
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EID: 77954099007
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (4)
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