Strain rate sensitivity of nanocrystalline Au films at room temperature

Acta Materialia

Volumn 58, Issue 14, 2010, Pages 4674-4684

  Jonnalagadda, K ^a   Karanjgaokar, N ^b   Chasiotis, I ^b   Chee, J ^c   Peroulis, D ^c  

^a INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^c PURDUE UNIVERSITY   (United States)

Author keywords

Creep tests; Ductility; Microvoids; Nanocrystalline materials; Thin films

Indexed keywords

ACTIVATION VOLUME; AU FILM; CREEP TESTS; EFFECT OF STRAIN; INITIAL STRAINS; MECHANICAL RESPONSE; MICRO VOIDS; MICRO-SCALES; NANOCRYSTALLINES; PRIMARY CREEP; RATE SENSITIVE; RATE SENSITIVITY; ROOM TEMPERATURE; SLOW STRAIN RATES; STRAIN RATE SENSITIVITY; ULTIMATE TENSILE STRENGTH; YIELD STRENGTH;

CREEP; DUCTILITY; GOLD; GRAIN BOUNDARIES; NANOCRYSTALLINE MATERIALS; TENSILE STRAIN; TENSILE STRENGTH; THIN FILMS; YIELD STRESS;

STRAIN RATE;

EID: 77954085896     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.04.048     Document Type: Article

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