Analysis of human faces using a measurement-based skin reflectance model

ACM SIGGRAPH 2006 Papers, SIGGRAPH '06

Volumn , Issue , 2006, Pages 1013-1024

  Weyrich, Tim ^a   Matusik, Wojciech ^b   Pfister, Hanspeter ^b   Bickel, Bernd ^a   Donner, Craig ^c   Tu, Chien ^b   McAndless, Janet ^b   Lee, Jinho ^b   Ngan, Addy ^d   Jensen, Henrik Wann ^c   Gross, Markus ^a  

^a ETH ZURICH   (Switzerland)

^b MERL ^*  (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

data driven models; face modeling; reflection models

Indexed keywords

3D FACES; DATA-DRIVEN MODEL; EXTERNAL FACTORS; FACE MODELING; FACE SYNTHESIS; HIGH QUALITY; HUMAN FACES; MEASURED DATA; MEASUREMENT-BASED; MODEL PARAMETERS; REFLECTANCE MODEL; REFLECTION MODELS; RESEARCH COMMUNITIES; SAMPLE POPULATION; SMALL-SCALE FEATURES; SUBSURFACE SCATTERING; TEXTURE SYNTHESIS;

PHOTOGRAPHY; POPULATION STATISTICS; REFLECTION;

INTERACTIVE COMPUTER GRAPHICS;

EID: 77954006388     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1179352.1141987     Document Type: Conference Paper

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