Localized plasmonic losses at metal back contacts of thin-film silicon solar cells

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7725, Issue , 2010, Pages

  Paetzold, U W ^a   Hallermann, F ^b   Pieters, B E ^a   Rau, U ^a   Carius, R ^a   Von Plessen, G ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Light Trapping; Optical Losses; Plasmon; Thin Film Solar Cell

Indexed keywords

AT-WAVELENGTH; BACK CONTACT; CROSS SECTION; ELECTRIC FIELD PROFILES; HIGH REFLECTIVITY; INDUCED ABSORPTION; INDUCED LOSS; LIGHT TRAPPING; MAXWELL'S EQUATIONS; NANOPROTRUSIONS; NUMERICAL SOLVERS; SHORTER WAVELENGTH; SILVER LAYER; SOLAR CELL PERFORMANCE; SPATIAL ABSORPTION; SURROUNDING MATERIALS; THIN FILM SOLAR CELLS; THIN-FILM SILICON SOLAR CELLS; ZNO;

ABSORPTION; ELECTRIC FIELDS; ELECTROMAGNETIC WAVES; ELECTROMAGNETISM; LIGHT REFRACTION; MAXWELL EQUATIONS; OPTICAL DATA STORAGE; OPTICAL LOSSES; ORGANIC POLYMERS; PLASMONS; REFRACTIVE INDEX; REFRACTOMETERS; RESONANCE; SILICON SOLAR CELLS; SOLAR CELLS; SOLAR CONCENTRATORS; SOLAR ENERGY; SOLAR RADIATION; THIN FILMS; ZINC OXIDE;

SILVER;

EID: 77953756436     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.854430     Document Type: Conference Paper

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