Edge-based blur metric for tamper detection

Journal of Information Hiding and Multimedia Signal Processing

Volumn 1, Issue 1, 2010, Pages 20-27

  Cao, Gang ^a   Zhao, Yao ^a   Ni, Rongrong ^a  

^a BEIJING JIAOTONG UNIVERSITY   (China)

Author keywords

Blur detection; Edge based blur metric; Image forensics

Indexed keywords

BLIND FORENSICS; BLUR DETECTION; DIGITAL PHOTOGRAPHS; EDGE-BASED; IMAGE FORENSICS; LINEAR FITTING; NATURAL IMAGES; TAMPER DETECTION;

ELECTRICAL ENGINEERING; SIGNAL PROCESSING;

PHOTOGRAPHY;

EID: 77953651461     PISSN: 20734212     EISSN: 20734239     Source Type: Journal    
DOI: None     Document Type: Article

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