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Volumn , Issue , 2006, Pages 33-39

Recognizing behavioral patterns at runtime using finite automata

Author keywords

design pattern recognition; finite automata; static and dynamic analysis; tracing

Indexed keywords

ACCURATE DESIGN; BEHAVIORAL PATTERNS; DESIGN PATTERN RECOGNITION; DESIGN PATTERNS; EMPIRICAL STUDIES; INTERNAL CHARACTERISTICS; REVERSE ENGINEERS; RUNTIMES; SOFTWARE STRUCTURES; STATIC AND DYNAMIC ANALYSIS; STRUCTURAL ASPECTS;

EID: 77953563412     PISSN: 02705257     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1138912.1138920     Document Type: Conference Paper
Times cited : (32)

References (15)
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  • 9
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    • Selective Tracing for Dynamic Analyses
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    • th WCRE, Pittsburgh, PA, USA, volume 2005-12 of Technical Report, pages 33-37. Universiteit Antwerpen, Belgium, November 2005.
    • (2005) th WCRE, Pittsburgh, PA, USA , vol.2005 , Issue.12 , pp. 33-37
    • Meyer, M.1    Wendehals, L.2
  • 11
    • 37849021875 scopus 로고    scopus 로고
    • InsECTJ: A Generic Instrumentation Framework for Collecting Dynamic Information within Eclipse
    • San Diego, CA, USA, October
    • A. Seesing and A. Orso. InsECTJ: A Generic Instrumentation Framework for Collecting Dynamic Information within Eclipse. In Proceedings of the eclipse Technology eXchange (eTX) Workshop at OOPSLA 2005, pages 49-53, San Diego, CA, USA, October 2005.
    • (2005) Proceedings of the Eclipse Technology EXchange (ETX) Workshop at OOPSLA 2005 , pp. 49-53
    • Seesing, A.1    Orso, A.2
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    • University of Paderborn, Germany Online at
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.