On the impact of outliers on high-dimensional data analysis methods for face recognition

ACM International Conference Proceeding Series

Volumn 160, Issue , 2005, Pages 43-49

  Berrani, Sid Ahmed ^a   Garcia, Christophe ^a  

^a ORANGE LABS   (France)

Author keywords

dimensionality curse; face recognition; high dimensional data analysis; outliers

Indexed keywords

DIMENSIONAL SPACES; FACE IMAGES; FACE RECOGNITION METHODS; FILTERING PROCESS; HIGH DIMENSIONAL DATA; PERFORMANCE DEGRADATION; RECOGNITION RATES; TRAINING PHASE; VARIABLE ILLUMINATION;

COMPUTER VISION; DATA REDUCTION;

FACE RECOGNITION;

EID: 77953511594     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1160939.1160952     Document Type: Conference Paper

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