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Volumn 46, Issue 24, 2010, Pages 4238-4248

Voltammetry as a probe of displacement

Author keywords

[No Author keywords available]

Indexed keywords

NANOPARTICLE;

EID: 77953298324     PISSN: 13597345     EISSN: None     Source Type: Journal    
DOI: 10.1039/c0cc00147c     Document Type: Review
Times cited : (8)

References (57)
  • 4
    • 77953309158 scopus 로고    scopus 로고
    • private communication
    • E. J. F. Dickinson, private communication
    • Dickinson, E.J.F.1
  • 20
    • 0003853137 scopus 로고    scopus 로고
    • A. J. Bard and M. V. Mirkin, Marcel Dekker, New York, Ed.
    • Scanning Electrochemical Microscopy, ed., A. J. Bard, and, M. V. Mirkin,, Marcel Dekker, New York, 2001
    • (2001) Scanning Electrochemical Microscopy
  • 34
    • 18544376030 scopus 로고    scopus 로고
    • H. O. Finklea, I. Rubenstein, J. F. Rusling and M. Fujihira, Weinheim, Wiley-VCH, Ed.
    • Encyclopedia of Electrochemistry, ed., H. O. Finklea,,, I. Rubenstein,,, J. F. Rusling, and, M. Fujihira,, Weinheim, Wiley-VCH, 2005, vol. 10
    • (2005) Encyclopedia of Electrochemistry


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.