A new noise-resistant algorithm for edge detection

2nd International Workshop on Education Technology and Computer Science, ETCS 2010

Volumn 1, Issue , 2010, Pages 47-50

  Sun, Xikui ^a   Sun, Genyun ^b  

^a PEKING UNIVERSITY   (China)

^b CHINA UNIVERSITY OF PETROLEUM   (China)

Author keywords

Edge detection; Image processing; Noise

Indexed keywords

EDGE DETECTION ALGORITHMS; EDGE INFORMATION; EDGE MAP; IMAGE PIXELS; MULTISPECTRAL IMAGES;

CLUSTERING ALGORITHMS; COMPUTER SCIENCE; EDUCATION COMPUTING; ENGINEERING EDUCATION; IMAGE PROCESSING; IMAGING SYSTEMS; PIXELS;

EDGE DETECTION;

EID: 77953207807     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETCS.2010.192     Document Type: Conference Paper

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