Quality control of coins mint using PIXE and RBS analysis

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 11-12, 2010, Pages 1916-1919

  Roumie, M ^a   Nsouli, B ^a   Chalhoub, G ^b   Hamdan, M ^b  

^a NATIONAL COUNCIL FOR SCIENTIFIC RESEARCH   (Lebanon)

^b Banque du Liban   (Lebanon)

Author keywords

Coins; IBA; PIXE; Quality control; RBS

Indexed keywords

COATED LAYERS; COINS; ELEMENTAL COMPOSITIONS; ELEMENTAL CONTENTS; EXPERIMENTAL PROTOCOLS; PIXE AND RBS ANALYSIS; PROTON INDUCED X-RAY EMISSIONS; RUTHERFORD BACK-SCATTERING SPECTROMETRY;

CUSTOMER SATISFACTION; PROTONS; QUALITY ASSURANCE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TOTAL QUALITY MANAGEMENT;

QUALITY CONTROL;

EID: 77953139088     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.02.101     Document Type: Article

References (9)

1. Meyer M.A., and Demortier G. Nucl. Instr. and Meth. B 49 (1990) 300
2. Šmit Z., and Šemrov A. Nucl. Instr. and Meth. B 252 (2006) 290
3. Abraham M.H., Grime G.W., Northover J.P., and Smith C.W. Nucl. Instr. and Meth. B 150 (1999) 651
4. Beck L., Alloin E., Berthier C., Reveillon S., and Costa V. Nucl. Instr. and Meth. B 266 (2008) 2320
5. Roumié M., Nsouli B., Zahraman K., and Reslan A. Nucl. Instr. and Meth. B 219-220 (2004) 389
6. Harrison J.F., and Eldred R.A. Adv. X-ray Anal. 17 (1973) 560
7. Nejedly Z., Campbell J.L., and Gama S. Nucl. Instr. and Meth. B 219-220 (2004) 136
8. Maxwell J.A., Teesdale W.J., and Campbell J.A. Nucl. Instr. and Meth. B 95 (1995) 407
9. Mayer M. SIMNRA User's Guide, Report IPP 9/113 (1997), Max-Planck-Institut für Plasmaphysik, Garching, Germany