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Volumn 256, Issue 21, 2010, Pages 6179-6185

Characterization of mesoporous VO x /MCM-41 composite materials obtained via post-synthesis impregnation

Author keywords

MCM 41; Mesoporous; VO x MCM 41 composites; X ray diffractometry; X ray photelectron spectroscopy

Indexed keywords

COMPOSITE MATERIALS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MESOPOROUS MATERIALS; SILICON COMPOUNDS; SOLUTIONS; VANADIUM PENTOXIDE; X RAY DIFFRACTION ANALYSIS;

EID: 77953130220     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.03.137     Document Type: Article
Times cited : (29)

References (35)
  • 18
    • 77953135784 scopus 로고    scopus 로고
    • JCPDS, International Centre for Diffraction Data, PCPDFWIN, JCPDS-ICDD, 1995.
    • JCPDS, International Centre for Diffraction Data, PCPDFWIN, JCPDS-ICDD, 1995.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.