Void formation and opacity in latex films with aluminum phosphate particles

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 363, Issue 1-3, 2010, Pages 146-154

  Silva, Cristiane A ^a   Galembeck, Fernando ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

Kubelka Munk; Light scattering; Opacity; Voids

Indexed keywords

ALUMINUM; AMORPHOUS FILMS; LATEXES; LIGHT SCATTERING; OXIDE MINERALS; REFRACTION; REFRACTIVE INDEX; RESINS; SCATTERING; STYRENE; TRANSMISSION ELECTRON MICROSCOPY;

ACRYLIC LATEXES; AIR VOIDS; ALUMINUM PHOSPHATES; CALCULATED VALUES; CONTRAST RATIO; DRY FILMS; DRYING HISTORY; FILM SCATTERING; KUBELKA-MUNK; LATEX FILMS; OPAQUE FILMS; PARTICLE CONCENTRATIONS; RUTILE PARTICLES; SCATTERING CO-EFFICIENT; SCATTERING EFFICIENCY; SEM AND TEM; TRIMMED SURFACES; VOID FORMATION; VOID SIZE;

OPACITY;

ALUMINUM PHOSPHATE; COPOLYMER; LATEX; RESIN; STYRENE ACRYLIC ACID COPOLYMER; TITANIUM DIOXIDE; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL ANALYSIS; CONTROLLED STUDY; DISPERSION; FILM COATING; LIGHT RELATED PHENOMENA; LIGHT SCATTERING; PARTICLE SIZE; PRIORITY JOURNAL; PROCESS DESIGN; REFLECTOMETRY; REFRACTION INDEX; SCANNING ELECTRON MICROSCOPY; SPECTRAL SENSITIVITY; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 77953122674     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.colsurfa.2010.04.034     Document Type: Article

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