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Volumn 104, Issue 20, 2010, Pages

Direct observation of electron dephasing due to inelastic scattering from defects in weakly disordered AuPd wires

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS AND IMPURITIES; DEPHASING PROCESS; DIRECT OBSERVATION; ELECTRON DEPHASING; ELECTRON PHONON; LOW TEMPERATURES; METALLIC CONDUCTOR; METALLIC STRUCTURES; QUADRATIC TEMPERATURE; RELAXATION RATES; TEMPERATURE RANGE;

EID: 77953087278     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.104.206803     Document Type: Article
Times cited : (31)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.