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Volumn 5, Issue 6, 2010, Pages 1051-1056

A new method for lift-off of III-nitride semiconductors for heterogeneous integration

Author keywords

III nitride semiconductor; Lift off; Nanorod

Indexed keywords

GAN EPILAYERS; GAN FILM; GAN SUBSTRATE; HETEROGENEOUS INTEGRATION; HIGH QUALITY; III-NITRIDE; III-NITRIDE SEMICONDUCTOR; III-NITRIDE SEMICONDUCTORS; LATERAL OVERGROWTH; LOW-DISLOCATION DENSITY; MASK LAYER; NANO-POROUS; NANOSTRUCTURED SURFACE; OVERLAYERS; POWER DEVICES; WET-CHEMICAL ETCHING;

EID: 77953082678     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1007/s11671-010-9601-6     Document Type: Article
Times cited : (23)

References (42)
  • 15
    • 11744387950 scopus 로고    scopus 로고
    • 3rd edn. ed. by MIR. Brozel, G. E. Stillman (INSPEC, the Institute of Electrical Engineering, London)
    • E. Yablonovitech, in Properties of Gallium Arsenide, 3rd edn. ed. by MIR. Brozel, G. E. Stillman (INSPEC, the Institute of Electrical Engineering, London, 1996), pp. 672-676.
    • (1996) Properties of Gallium Arsenide , pp. 672-676
    • Yablonovitech, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.