Dip pen nanolithography of conductive silver traces

Journal of Physical Chemistry C

Volumn 114, Issue 21, 2010, Pages 9672-9677

  Hung, Sheng Chun ^a   Nafday, Omkar A ^a   Haaheim, Jason R ^a   Ren, Fan ^b   Chi, G C ^c   Pearton, Stephen J ^d  

^a NanoInk ^*  (United States)

^b University of Florida   (United States)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^d UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING CONDITION; BULK RESISTIVITY; DIP-PEN NANOLITHOGRAPHY; DIRECT WRITE; ELECTRODE PATTERN; FUNCTIONALIZATIONS; GAS SENSING; LOW VISCOSITY; METALLIC MATERIAL; MULTIPLE SUBSTRATES; ORDERS OF MAGNITUDE; PRINTABLE ELECTRONICS; SENSOR ELEMENTS; SILVER NANOPARTICLES; SITE-SPECIFIC; SPECIFIC LOCATION; WRITE SPEED; WRITING SPEED;

CONDUCTIVE MATERIALS; FAILURE ANALYSIS; GAS SENSING ELECTRODES; GOLD DEPOSITS; INK; MICA; NANOLITHOGRAPHY; POLYIMIDES; QUALITY ASSURANCE; SILICATE MINERALS; SILICON COMPOUNDS;

SILVER;

EID: 77952999576     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp101505k     Document Type: Article

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