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Volumn 49, Issue 5 PART 2, 2010, Pages
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Low-temperature solution-deposited oxide thin-film transistors based on solution-processed organic-inorganic hybrid dielectrics
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL DAMAGES;
COHERENT INTERFACE;
FIELD-EFFECT MOBILITIES;
HYBRID DIELECTRICS;
INDIUM ZINC OXIDES;
LOW TEMPERATURES;
LOW THRESHOLDS;
OFF-CURRENT;
ORGANIC-INORGANIC HYBRID;
OXIDE SEMICONDUCTOR;
PROCESSABLE MATERIALS;
SOLUTION-PROCESSED;
SOLUTION-PROCESSING;
VISIBLE REGION;
AMORPHOUS FILMS;
GATE DIELECTRICS;
GATES (TRANSISTOR);
GELS;
SEMICONDUCTING INDIUM;
SEMICONDUCTING ORGANIC COMPOUNDS;
THIN FILM TRANSISTORS;
THRESHOLD LOGIC;
ZINC;
ZINC OXIDE;
DIELECTRIC MATERIALS;
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EID: 77952991479
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.49.05EB02 Document Type: Article |
Times cited : (12)
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References (17)
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