Improved micro x-ray fluorescence spectrometer for light element analysis

Review of Scientific Instruments

Volumn 81, Issue 5, 2010, Pages

  Smolek, Stephan ^a   Streli, Christina ^a   Zoeger, Norbert ^a   Wobrauschek, Peter ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CU K-EDGE; DETECTION LIMITS; EFFECTIVE BEAMS; FLUORESCENT RADIATION; LASER PRINTS; LIGHT ELEMENT ANALYSIS; LIGHT ELEMENTS; LOWER LIMITS OF DETECTIONS; MAPPING CAPABILITIES; MICRO X-RAY FLUORESCENCE; MICRO-XRF; PARTS PER MILLIONS; SPOT SIZES; STANDARD REFERENCE MATERIAL; THIN METAL FOIL; VACUUM CONDITION;

CHEMICAL ELEMENTS; COMPUTER CONTROL SYSTEMS; FLUORESCENCE; METAL FOIL; SPECTROMETRY;

SPECTROMETERS;

EID: 77952990025     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3428739     Document Type: Article

References (17)

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