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Journal of Vacuum Science and Technology B

Volumn 28, Issue 3, 2010, Pages

Frequency modulation atomic force microscope observation of TiO2 (110) surfaces in water

(2) Sasahara, Akira a Tomitori, Masahiko a

a JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; FREQUENCY MODULATION; HYDROGEN BONDS; HYDROPHOBICITY; MOLECULES; OXIDE MINERALS; SURFACE CHEMISTRY;

AR+ SPUTTERING; ATTRACTIVE FORCE; FREQUENCY MODULATION-ATOMIC FORCE MICROSCOPES; HYDROGEN BONDING NETWORK; HYDROPHILICS; ORDER-DISORDER TRANSITION; REPULSIVE FORCES; SPUTTER-ANNEALED SURFACE; STEP-TERRACE STRUCTURE; TOPOGRAPHY IMAGES;

TITANIUM DIOXIDE;

EID: 77952967730 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.3294707 Document Type: Conference Paper

Times cited : (9)

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