Important physical parameters of Bi2O3 thin films found by applying several models for optical data

Crystal Research and Technology

Volumn 45, Issue 5, 2010, Pages 503-511

  Condurache Bota, S ^a   Rusu, G I ^b   Tigau, N ^a   Leontie, L ^b  

^a DUNAREA DE JOS UNIVERSITY OF GALATI   (Romania)

^b NATIONAL INSTITUTE OF RESEARCH AND DEVELOPMENT FOR TECHNICAL PHYSICS   (Romania)

Author keywords

Cauchy; Dielectric constant; Refractive index; Sellmeier; Tauc's formula

Indexed keywords

CAUCHY; COMPLEX DIELECTRIC CONSTANT; DEPOSITION PARAMETERS; DIELECTRIC CONSTANTS; ELECTRONIC TRANSITION; GLASS SUBSTRATES; OPTICAL DATA; OPTICAL ENERGY; OPTICAL PARAMETER; OPTICAL TRANSMISSIONS; PHYSICAL PARAMETERS; REAL PART; REFLECTION SPECTRA; REFRACTION INDEX; SUBSTRATE TEMPERATURE; THIN SOLID FILM; X RAY DIFFRACTOMETRY; SELLMEIER; TAUC'S FORMULA;

ABSORPTION SPECTROSCOPY; BISMUTH; LIGHT REFRACTION; MODELS; OPTICAL VARIABLES CONTROL; PERMITTIVITY; REFRACTIVE INDEX; REFRACTOMETERS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

LIGHT TRANSMISSION; MODELS;

EID: 77952961664     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.201000074     Document Type: Article

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