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Volumn , Issue , 2007, Pages 399-403

Inductor based switching DC-DC converter for low voltage power distribution in SLHC

Author keywords

[No Author keywords available]

Indexed keywords

HARSH RADIATION ENVIRONMENT; HIGH MAGNETIC FIELDS; LOW VOLTAGES; MAGNETIC COMPONENTS; POWER DISTRIBUTIONS; STEP-DOWN CONVERSION; SWITCHING DC-DC CONVERTERS;

EID: 77952959041     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (7)
  • 1
    • 0002273701 scopus 로고    scopus 로고
    • Total dose and single event effects (SEE) in a 0.25 μm CMOS technology
    • (Roma), Università di Roma "La Sapienza", September
    • F. Faccio, G. Anelli, et al., "Total dose and Single Event Effects (SEE) in a 0.25 μm CMOS technology," in 4th Workshop on electronics for LHC experiments, (Roma), Università di Roma "La Sapienza", September 1998.
    • (1998) 4th Workshop on Electronics for LHC Experiments
    • Faccio, F.1    Anelli, G.2
  • 3
    • 33144457628 scopus 로고    scopus 로고
    • Radiation-induced edge effects in deep submicron CMOS transistors
    • December
    • F Faccio and G. Cervelli, "Radiation-induced edge effects in deep submicron CMOS transistors," IEEE Transactions on Nuclear Science, vol. 52, pp. 2413-2420, December 2005.
    • (2005) IEEE Transactions on Nuclear Science , vol.52 , pp. 2413-2420
    • Faccio, F.1    Cervelli, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.