A multi-scale characterization of deformation twins in Ti6Al4V sheet material deformed by simple shear

Materials Science and Engineering: A

Volumn 527, Issue 16-17, 2010, Pages 4136-4145

  Tirry, W ^a,c   Coghe, F ^a   Bouvier, S ^b   Gasperini, M ^b   Rabet, L ^a   Schryvers, D ^c  

^a ROYAL MILITARY ACADEMY   (Belgium)

^b UNIVERSITÉ PARIS 13   (France)

^c UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Deformation twinning; EBSD; Optical microscopy; Simple shear; TEM; Ti6Al4V

Indexed keywords

ALUMINUM ALLOYS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LIGHT TRANSMISSION; OPTICAL DATA STORAGE; OPTICAL MICROSCOPY; SHEAR STRESS; STACKING FAULTS; STRAIN HARDENING; STRESS ANALYSIS; TERNARY ALLOYS; TWINNING; VANADIUM ALLOYS;

DEFORMATION TWIN; DEFORMATION TWINNING; EBSD; ELECTRON BACKSCATTER DIFFRACTION TECHNIQUE; MULTI-SCALES; SCALE CHARACTERIZATION; SHEET MATERIAL; SIMPLE SHEAR; STRAIN RATIOS; TEM;

TITANIUM ALLOYS;

EID: 77952877022     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2010.03.039     Document Type: Article

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