Intragranular defects and shock sensitivity of RDX/HMX

Hanneng Cailiao/Chinese Journal of Energetic Materials

Volumn 18, Issue 2, 2010, Pages 152-156

  Hua, Cheng ^a   Huang, Ming ^a   Huang, Hui ^a   Li, Jin Shan ^a   Nie, Fu De ^a   Dai, Bin ^a  

^a RESEARCH CENTER OF LASER FUSION   (China)

Author keywords

Characterization method; Crystal internal defect; Explosion mechanics; Reduced sensitivity HMX; Reduced sensitivity RDX; Shock sensitivity

Indexed keywords

EID: 77952833192     PISSN: 10069941     EISSN: None     Source Type: Journal    
DOI: 10.3969/j.issn.1006-9941.2010.02.007     Document Type: Article

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