Thickness and temperature effects on magnetic properties and roughness of L10-ordered FePt films

IEEE Transactions on Magnetics

Volumn 46, Issue 6, 2010, Pages 2282-2285

  Kim, Chang Soo ^a   Sapan, Jonathan J ^b   Moyerman, Stephanie ^b   Lee, Kangho ^c   Fullerton, Eric E ^b   Kryder, Mark H ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c QUALCOMM INC   (United States)

Author keywords

L10 ordered FePt; Perpendicular magnetic tunnel junction; Surface roughness; Ta and MgO seed layers

Indexed keywords

BINARY ALLOYS; GRAIN GROWTH; IRON ALLOYS; MAGNESIA; MAGNETIC ANISOTROPY; MAGNETIC DEVICES; MAGNETISM; MORPHOLOGY; OXIDE MINERALS; PLATINUM ALLOYS; SILICON WAFERS; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY; TUNNEL JUNCTIONS;

CRYSTALLINE ORDER; DEPOSITION TEMPERATURES; FEPT GRAINS; GROWTH EFFECTS; L10-ORDERED FEPT; MAGNETIC TUNNEL JUNCTION; PERPENDICULAR MAGNETIC ANISOTROPY; THERMALLY OXIDIZED;

IRON METALLOGRAPHY;

EID: 77952824736     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2010.2045485     Document Type: Article

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