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Volumn , Issue , 2010, Pages

Probability of failure of safety-critical systems subject to partial tests

Author keywords

Full tests; Partial tests; Probability of failure on demand; Proof tests; Safety instrumented systems

Indexed keywords

AS GOOD AS NEW; K-OUT-OF-N; PARTIAL STROKE TESTING; PROBABILITY OF FAILURE; PROBABILITY OF FAILURE ON DEMAND; PROOF TEST; SAFETY CRITICAL SYSTEMS; SAFETY INSTRUMENTED SYSTEMS; SYSTEM AVAILABILITY; SYSTEM FAILURES; TEST EFFECTIVENESS; TEST STRATEGIES; TEST TIME; VISUAL INSPECTION;

EID: 77952787654     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2010.5447972     Document Type: Conference Paper
Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.