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Volumn , Issue , 2010, Pages

Temperature acceleration models in reliability predictions: Justification & improvements

Author keywords

Accelerated testing; Activation energy; Arrhenius; FIDES; GLL models; Maximum likelihood

Indexed keywords

ACCELERATED TESTING; ACCELERATION FACTORS; ACCELERATION MODELS; AERONAUTIC APPLICATIONS; ARRHENIUS; ARRHENIUS MODELS; BILL OF MATERIALS; COMPONENT INTEGRATION; COMPONENT MANUFACTURERS; COMPONENT RELIABILITY; DEVELOPMENT PHASE; ELECTRONIC COMPONENT; EMPIRICAL DATA; FIDES; HIGH RELIABILITY; NEW MECHANISMS; PHYSICS OF FAILURES; RELIABILITY PREDICTION; STEADY-STATE TEMPERATURE;

EID: 77952764327     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2010.5448028     Document Type: Conference Paper
Times cited : (49)

References (15)
  • 1
    • 0000804930 scopus 로고
    • Über die Reaktion-geschwindigkeit bei der Inversion vor Rhorzücker durch Sauren
    • S. Arrhenius, "Über die Reaktion-geschwindigkeit bei der Inversion vor Rhorzücker durch Sauren", Z. Phys.-Ch., 1889.
    • (1889) Z. Phys.-Ch.
    • Arrhenius, S.1
  • 3
    • 0000428632 scopus 로고
    • The failure law of complex equipment
    • December
    • R.F. Drenick, "The failure law of complex equipment" Journal Soc. Indust. AppL. Math, Vol8, No.4, December 1960.
    • (1960) Journal Soc. Indust. AppL. Math , vol.8 , Issue.4
    • Drenick, R.F.1
  • 11
    • 0000793139 scopus 로고
    • Cramming more components onto integrated circuits
    • G.Moore "Cramming more components onto integrated circuits" Electronics Volume 38 Number 8 April 1965
    • (1965) Electronics , vol.38 , Issue.8
    • Moore, G.1
  • 13
    • 77952764820 scopus 로고    scopus 로고
    • Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach
    • M.Pecht, P.Lall, H.Hakim "Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach", Lavoisier 2006
    • (2006) Lavoisier
    • Pecht, M.1    Lall, P.2    Hakim, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.