Efficient analysis of imperfect coverage systems with functional dependence

Proceedings - Annual Reliability and Maintainability Symposium

Volumn , Issue , 2010, Pages

  Xing, Liudong ^a   Morrissette, Brock A ^b   Dugan, Joanne Bechta ^c  

^a Department of Electrical and Computer Engineering   (United States)

^b LOCKHEED MARTIN   (United States)

^c University of Virginia   (United States)

Author keywords

Combinatorial method; Functional dependence; Imperfect fault coverage; Reliability analysis

Indexed keywords

COMBINATORIAL APPROACH; COMBINATORIAL METHOD; COMBINATORICS; DIVIDE AND CONQUER; EFFICIENT ANALYSIS; EXPONENTIAL TIME; FUNCTIONAL DEPENDENCE; IMPERFECT COVERAGE; IMPERFECT FAULT COVERAGE; IMPERFECT FAULT COVERAGES; MARKOV MODEL; STATE-SPACE EXPLOSION; SYSTEM COMPONENTS; SYSTEM SOLUTION; TIME TO FAILURE;

MAINTAINABILITY; MARKOV PROCESSES; QUALITY ASSURANCE; QUALITY CONTROL;

RELIABILITY ANALYSIS;

EID: 77952760830     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2010.5447994     Document Type: Conference Paper

References (6)

1. K. B. Misra (Editor), Handbook of Performability Engineering, Springer-Verlag, London, ISBN: 978-1-84800-130-5, Oct 2008.
2. J. B. Dugan and S. A. Doyle, "New results in fault-tree analysis," Tutorial notes of the Annual Reliability & Maintainability Symposium, Jan 1997
3. S. V. Amari, J. B. Dugan, and R. B. Misra, "A separable method for incorporating imperfect fault-coverage into combinatorial models," IEEE Trans. Reliability, pp. 267-274, Sep 1999.
4. L. Xing and J. B. Dugan, "Analysis of generalized phased-mission system reliability, performance and sensitivity," IEEE Trans. Reliability, vol. 51, no. 2, pp. 199-211, Jun 2002.
5. L. Xing and Y.S. Dai, "A new decision diagram based method for efficient analysis on multi-state systems," IEEE Trans. Dependable and Secure Computing, vol. 6, no. 3, pp. 161-174, Jul-Sep 2009.
6. A. Shrestha and L. Xing, "A logarithmic binary decision diagrams-based method for multistate systems analysis," IEEE Trans Reliability, vol. 57, no. 4, pp. 595-606, Dec 2008.