|
|
Volumn 27, Issue 3, 2010, Pages 86-87
|
|
Scaling: More than Moore's law
|
|
Author keywords
Design and test; ITRS; Moore's law; Scaling
|
|
Indexed keywords
DESIGN TECHNOLOGIES;
DIFFERENTIATORS;
ELECTRONICS COMPANY;
GEOMETRICAL SCALING;
INTERNATIONAL TECHNOLOGY ROADMAP FOR SEMICONDUCTORS;
ITRS;
MOORE'S LAW;
PACKAGING INNOVATION;
SCALE INTEGRATION;
CHIP SCALE PACKAGES;
INNOVATION;
TAXONOMIES;
TECHNOLOGICAL FORECASTING;
TECHNOLOGY;
DESIGN;
|
|
EID: 77952728700
PISSN: 07407475
EISSN: None
Source Type: Journal
DOI: 10.1109/MDT.2010.71 Document Type: Article |
|
Times cited : (59)
|
|
References (0)
|
