Array of two UV-wavelength detector types

IEEE Transactions on Electron Devices

Volumn 57, Issue 6, 2010, Pages 1224-1229

  Ngu, Yves ^a   Peckerar, M C ^b   Sander, D ^b   Eddy Jr , Charles R ^c   Mastro, Michael A ^c   Hite, Jennifer K ^c   Holm, R T ^c   Henry, R L ^c   Tuchman, A ^d  

^a IBM MICROELECTRONICS   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

^c NAVAL RESEARCH LABORATORY   (United States)

^d TechnoVentures LLC   (United States)

Author keywords

Solid state imagers; UV imaging; Wide band gap semiconductor applications

Indexed keywords

GROWTH METHOD; LAYER STACKING; SOLID-STATE IMAGERS; SPECTRAL RESPONSIVITY; UV IMAGING; WAVELENGTH DETECTION; WAVELENGTH DETECTOR; WAVELENGTH SENSITIVITY; WIDE-BAND-GAP SEMICONDUCTOR;

CRYSTAL GROWTH; PIXELS; SEMICONDUCTOR GROWTH; SIGNAL TO NOISE RATIO; STOICHIOMETRY;

DETECTORS;

EID: 77952714341     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2010.2045706     Document Type: Article

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