Modified elliptically polarized light Z-scan method for studying third-order nonlinear susceptibility components

Optics Express

Volumn 18, Issue 10, 2010, Pages 10270-10281

  Yan, Xiao Qing ^a   Liu, Zhi Bo ^a   Zhang, Xiao Liang ^a   Zang, Wei Ping ^a   Tian, Jian Guo ^a  

^a NANKAI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL RESULTS; CROSS-POLARIZED; ELLIPTICALLY POLARIZED LIGHT; NONLINEAR ABSORPTIONS; POTENTIAL APPLICATIONS; QUARTER WAVE-PLATE; REAL PART; THIRD-ORDER NONLINEAR SUSCEPTIBILITY; THIRD-ORDER SUSCEPTIBILITY; WAVE GENERATION; Z-SCAN METHOD;

LIGHT POLARIZATION;

ARTICLE; COMPUTER SIMULATION; LIGHT; METHODOLOGY; NONLINEAR SYSTEM; RADIATION SCATTERING; REFRACTOMETRY; THEORETICAL MODEL;

COMPUTER SIMULATION; LIGHT; MODELS, THEORETICAL; NONLINEAR DYNAMICS; REFRACTOMETRY; SCATTERING, RADIATION;

EID: 77952709210     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.010270     Document Type: Article

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