Analysis of cross-section structure of a polymer wrapping film using infrared attenuated total reflection imaging technique with an aid of chemometrics

Journal of Physical Chemistry B

Volumn 114, Issue 20, 2010, Pages 6878-6885

  Sakabe, Terumi ^a   Yamazaki, Satoru ^a   Hasegawa, Takeshi ^b  

^a ASAHI KASEI CORPORATION   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION;

ADHESIVE STRUCTURE; ADJACENT LAYERS; ANALYTICAL TECHNIQUES; ATTENUATED TOTAL REFLECTIONS; CHEMOMETRIC ANALYSIS; CHEMOMETRICES; CHEMOMETRICS; CONCENTRATION PROFILES; INTERFACE STRUCTURES; LAYERED STRUCTURES; LEAST SQUARE; MAP IMAGE; MAPPING AREA; MAPPING TECHNIQUES; MICROSCOPIC IMAGING; POLYMER WRAPPING; PRE-TREATMENT; PRE-TREATMENTS; STRUCTURAL DIFFERENCES;

REGRESSION ANALYSIS;

EID: 77952705583     PISSN: 15206106     EISSN: 15205207     Source Type: Journal    
DOI: 10.1021/jp102726e     Document Type: Article

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