Production of graphene sheets by direct dispersion with aromatic healing agents

Small

Volumn 6, Issue 10, 2010, Pages 1100-1107

  Zhang, Ming ^a   Parajuli, Rishi R ^a   Mastrogiovanni, Daniel ^b   Dai, Boya ^c   Lo, Phil ^d   Cheung, William ^a   Brukh, Roman ^a   Chiu, Pui Lam ^a   Zhou, Tao ^d   Liu, Zhongfan ^c   Garfunkel, Eric ^b   He, Huixin ^a  

^a RUTGERS UNIVERSITY   (United States)

^b RUTGERS UNIVERSITY   (United States)

^c PEKING UNIVERSITY   (China)

^d NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Doping agents; Graphene; Healing agents; Reparative thermal annealing; Transparent conductive oxides

Indexed keywords

1-PYRENEMETHYLAMINE; ABSORPTION CURVES; AFM; ANNEALED FILMS; ANODISC FILTERS; COLOR CODING; CONFOCAL IMAGING; CORE LEVELS; CORE-LEVEL PHOTOEMISSION; DIFFERENT THICKNESS; DOPING AGENT; DOPING AGENTS; DOUBLE-BEAM; DROP COATINGS; ELECTRICAL AND OPTICAL PROPERTIES; EMISSION SPECTRUMS; EXFOLIATION PROCESS; EXPOSURE-TIME; FLUORESCENCE MEASUREMENTS; FLUORESCENCE SPECTRA; FLUORESCENCE SPECTROPHOTOMETER; FOUR-POINT; FRESHLY CLEAVED MICA; FUME HOODS; GRAPHENE SHEETS; GRAPHITE POWDER; HEMISPHERICAL ANALYZERS; HIGH-PURITY; INORGANIC MEMBRANES; MICA SURFACES; MICRO-RAMAN; MILLIPORE; MIXTURE SOLUTION; OPTICAL AND ELECTRICAL PROPERTIES; PYRENE DERIVATIVES; RAMAN SPECTRA; RENISHAW; RESISTIVITY PROBE; RESONANCE FREQUENCIES; ROOM TEMPERATURE; SALT HYDRATES; SANTA BARBARA; SCAN RATES; SECTION ANALYSIS; SIGMA-ALDRICH; SPRING CONSTANTS; STOCK SOLUTIONS; TAPPING MODES; THERMAL-ANNEALING; TIP RADIUS; TOPOGRAPHIC IMAGES; TRANSPARENT CONDUCTIVE OXIDES; UV-VIS-NIR ABSORPTION; UV-VIS-NIR SPECTROPHOTOMETERS; VACUUM FILTRATION; WAVELENGTH RANGES; WEIGHT RATIOS; WHATMAN; X-RAY SOURCES; XPS SPECTRA;

ABSORPTION; ABSORPTION SPECTROSCOPY; AIR FILTERS; ANNEALING; ATOMIC FORCE MICROSCOPY; BINDING ENERGY; CENTRIFUGATION; CONDUCTIVE FILMS; DEIONIZED WATER; DIALYSIS; ELECTRIC RESISTANCE; ELECTRONIC STATES; EMISSION SPECTROSCOPY; FLUORESCENCE; FUME CONTROL; GRAPHENE; GRAPHITE; HYDRATES; INFRARED DEVICES; METEOROLOGICAL INSTRUMENTS; MICA; MICROCHANNELS; MICROFILTRATION; NATURAL FREQUENCIES; OPTICAL FILMS; OPTICAL PROPERTIES; OXIDE MINERALS; PHOTOELECTRICITY; PYRENE; QUARTZ; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILICATE MINERALS; SILICONES; SPECTROPHOTOMETERS; SPECTROPHOTOMETRY; THERMAL CONDUCTIVITY; VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

FILM PREPARATION;

GRAPHITE; NANOMATERIAL; OXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; RAMAN SPECTROMETRY; SPECTROFLUOROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

GRAPHITE; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; OXIDES; PHOTOELECTRON SPECTROSCOPY; SPECTROMETRY, FLUORESCENCE; SPECTRUM ANALYSIS, RAMAN;

EID: 77952698909     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200901978     Document Type: Article

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