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Volumn , Issue PART A, 2008, Pages 39-46
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A systematic approach to wall roughness effects in laminar channel flows: Experiments and modelling
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Author keywords
[No Author keywords available]
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Indexed keywords
AIR FLOW;
ENTROPY PRODUCTION;
EXPERIMENTAL SETUP;
GAS FLOWS;
HOMOGENEOUS SURFACES;
LAMINAR CHANNEL FLOW;
NUMERICAL MODELS;
PARALLEL DISKS;
SMALL CHANNELS;
WALL ROUGHNESS;
COMPUTATIONAL FLUID DYNAMICS;
ERROR ANALYSIS;
EXPERIMENTS;
LAMINAR FLOW;
MICROCHANNELS;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON WAFERS;
PARALLEL FLOW;
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EID: 77952613388
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1115/ICNMM2008-62147 Document Type: Conference Paper |
Times cited : (5)
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References (12)
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