The effect of substrate temperature on optoelectronic characteristics of surface-textured ZnO:Al films for micromorph silicon tandem solar cells

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 7, Issue 3-4, 2010, Pages 925-928

  Kang, Dong Won ^a   Kuk, Seung Hee ^a   Ji, Kwang Sun ^b   Ahn, Seh Won ^b   Han, Min Koo ^a  

^a Seoul National University   (South Korea)

^b LG Electronics Inc   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AL CONTENT; CERAMIC TARGET; D.C. MAGNETRON SPUTTERING; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL RESISTIVITY; ENERGY DISPERSIVE X RAY SPECTROSCOPY; ETCH RATES; FILM DENSITY; HIGH TRANSMITTANCE; LOW COSTS; LOW RESISTIVITY; OPTOELECTRONIC CHARACTERISTICS; ROOM TEMPERATURE; SODA LIME GLASS SUBSTRATE; SUBSTRATE TEMPERATURE; TANDEM SOLAR CELLS; WET-CHEMICAL ETCHING; ZNO; ZNO:AL FILMS;

ALUMINUM; ELECTRIC CONDUCTIVITY; ETCHING; LIGHT REFRACTION; METALLIC FILMS; PHOTORESISTS; REFRACTIVE INDEX; REFRACTOMETERS; X RAY SPECTROSCOPY; ZINC OXIDE;

SUBSTRATES;

EID: 77952566478     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200982808     Document Type: Conference Paper

References (10)

1. J. Yoo, J. Lee, S. Kim, K. Yoon, I. Jun Park, S.K. Dhungel, B. Karunagaran, D. Mangalaraj, J. Yi, Thin Solid Films 480-481, 213 (2005).
2. J. Krč, M. Zeman, O. Kluth, F. Smole, M. Topic, Thin Solid Films 426, 296 (2003).
3. J. Muller, B. Rech, J. Springer, M. Vanecek, Sol. Energy 77, 917 (2004).
4. L.J. Meng and M.P. dos Santos, Thin Solid Films 250, 26 (1994).
5. J.F. Chang and M.H. Hon, Thin Solid Films 386, 79 (2001)
6. E.G.Fu, D.M. Zhuang, G. Zhang, W.F. Yang, M. Zhao, Appl. Surf. Sci. 217 88 (2003)
7. E. Burstein, Phys. Rev. 93, 455 (1954).
8. T.S. Moss, Proc. Phys. Soc. London Ser. B 67, 775 (1954).
9. C. Eisele, C.E. Nebel, and M. Stutzmann, J. Appl. Phys. 89 12 (2001)
10. V. Srikant and D.R. Clarke. J. Appl. Phys. 83, 5447 (1998).