Comparison of different ANN techniques for automatic defect detection in X-ray images

2009 International Conference on Emerging Trends in Electronic and Photonic Devices and Systems, ELECTRO '09

Volumn , Issue , 2009, Pages 193-197

  Rale, Amod P ^a   Gharpure, D C ^a   Ravindran, V R ^b  

^a UNIVERSITY OF PUNE   (India)

^b INDIAN SPACE RESEARCH ORGANISATION   (India)

Author keywords

ANN; NDT; Statistical analysis; X ray image

Indexed keywords

COMPLEX NETWORKS; DEFECTS; IMAGE ANALYSIS; IMAGE DENOISING; NEURAL NETWORKS; NOISE ABATEMENT; NONDESTRUCTIVE EXAMINATION; PHOTONIC DEVICES; PIXELS; STATISTICAL METHODS;

AUTOMATIC DEFECT DETECTIONS; CONVENTIONAL METHODS; DETECTION OF DEFECTS; IMAGE NOISE REDUCTION; NON-DESTRUCTIVE EVALUATION TECHNIQUES; PREPROCESSING TECHNIQUES; STRUCTURAL PATTERN; X-RAY IMAGE;

IMAGE ENHANCEMENT;

EID: 77952566136     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/electro.2009.5441138     Document Type: Conference Paper

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