Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure

Journal of Applied Crystallography

Volumn 43, Issue 3, 2010, Pages 504-510

  Halasz, Ivan ^a   Dinnebier, Robert E ^a   Angel, Ross ^b  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b ILSB   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77952535962     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810005856     Document Type: Article

References (24)

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