An investigation of goethite-seeded Al(OH)3 precipitation using in situ X-ray diffraction and Rietveld-based quantitative phase analysis

Journal of Applied Crystallography

Volumn 43, Issue 3, 2010, Pages 466-472

  Webster, Nathan A S ^a,b   Madsen, Ian C ^a   Loan, Melissa J ^a   Knott, Robert B ^b   Naim, Fatima ^a   Wallwork, Kia S ^c   Kimpton, Justin A ^c  

^a CSIRO   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^c AUSTRALIAN SYNCHROTRON   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77952526958     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810008484     Document Type: Article

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