Simulating and evaluating small-angle X-ray scattering of micro-voids in polypropylene during mechanical deformation

Journal of Applied Crystallography

Volumn 43, Issue 3, 2010, Pages 603-610

  Fischer, Stefan ^a   Diesner, Tobias ^b   Rieger, Bernhard ^b   Marti, Othmar ^a  

^a UNIVERSITY OF ULM   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77952473302     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810006163     Document Type: Article

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