A 45nm generation phase change memory technology

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2009, Pages

  Servalli, G ^a  

^a Numonyx   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL PROPERTY; HIGH DENSITY; NON-VOLATILE MEMORY APPLICATION; PHASE-CHANGE MEMORY TECHNOLOGIES;

ELECTRIC PROPERTIES; ELECTRON DEVICES; PULSE CODE MODULATION;

PHASE CHANGE MEMORY;

EID: 77952396902     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2009.5424409     Document Type: Conference Paper

References (4)

1. F. Pellizzer et al., VLSI Symp. on Tech., pp. 18, 2004.
2. F. Pellizzer et al., VLSI Symp. on Tech., pp. 122, 2006.
3. A. Pirovano et al., Proc. ESSDERC '07, pp. 222, 2007.
4. A. Redaelli et al., IEEE Elec. Dev. Lett., v.29, pp.41, 2008.